Abstract: Large tellurium inclusions in the matrix of as-grown cadmium manganese telluride (CdMnTe) crystals limit their ability to detect X-rays and gamma-rays at high resolutions. CdMnTe has potential applications in high-resolution nuclear and radiological detection at room-temperature. Defects associated with tellurium inclusions trap charges generated when CdMnTe detectors are irradiated with X-rays and gamma rays. This degrades the charge transport properties of the detectors and reduces lifetime of the charge carriers, which results in poor performance by the detector. Post-growth thermal annealing is often used to remove tellurium inclusions from the CdMnTe matrix.........
Keywords: CdMnTe, gamma-rays, infrared microscopy, tellurium inclusions, thermal annealing, X-rays
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