ABSTRACT: Nickel doped and undoped Zinc oxide thin films were prepared on soda-lime glass and indium tin oxide (ITO) coated substrates using a low-cost chemical spray pyrolysis technique. The effect of the Ni doping on the optical, surface morphological and rectifying properties of the thin films were investigated using a Uv-Visible spectrometer, X-ray diffractometer and Keithley multimeter.
The crystallographic studies revealed the polycrystalline nature of the prepared 0%, 2% and 5% Ni-doped ZnO thin film with the prominent peaks corresponding to crystal orientation plane (100), (002), (101),102), (110), (103) and (112) indexed to Zinciate phase that has hexagonal structure (Chinese white) and no traces of secondary phase. Optical analysis of Ni: ZnO thin films revealed......
Keyword: Optoelectronics, Polycrystalline, rectifying, bandgap.
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